Product Name
UltraFLEX Test System
Description
Designed for SoC devices built for mobile applications, networking, storage and high-end processing. Scales from low pin count, analog-dominant devices to parallel test of high-end processors. Features include control of all tester operations from a digital pattern; background digital signal processing with automatic data download up to 32 dedicated processing cores; and a range of coverage with gigahertz speeds and precision measurement for analog, digital and RF testing.
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